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SAE ARP 6338A:2019-02-08

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SAE ARP 6338A:2019-02-08

Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits

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This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations.
Author SAE
Editor SAE
Document type Standard
Format File
ICS 31.080.01 : Semiconductor devices in general
49.060 : Aerospace electric equipment and systems
Number of pages 14
Replace SAE ARP 6338:2015-12-06
Year 2019
Document history SAE ARP 6338:2015-12-06
Country USA
Keyword SAE 6338;SAE ARP6338A;SAE ARP6338A;SAE ARP 6338