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This standard deals with the measurement of surface contamination by direct measurement using a calibrated surface contamination monitor. In some cases where for example the background may be high or the surface is inaccessible to a probe, assessment may be made by indirect measurement using a wipe test.
Author | VDE |
---|---|
Editor | VDE |
Document type | Standard |
Format | Paper |
ICS | 17.240 : Radiation measurements
|
Number of pages | 43 |
Replace | DIN ISO 7503-1 (1990-07) |
Cross references | ISO 7503-1 (2016-01), IDT |
Weight(kg.) | 0.1731 |
Year | 2017 |
Document history | DIN ISO 7503-1 (2017-12) |
Country | Germany |
Keyword | DIN ISO 7503;7503 |