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The purpose of this International Standard is to define a test sequence that will quickly uncover CPV module failures that have been associated with field exposure to thermal cycling for many years. This standard was specifically developed to relate to thermal fatigue failure of the HCPV die attach, however will also apply, to some extent, to all thermal fatigue related failure mechanisms for the assemblies submitted to test.
Author | VDE |
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Editor | VDE |
Document type | Standard |
Format | Paper |
ICS | 27.160 : Solar energy engineering
|
Number of pages | 15 |
Replace | DIN EN 62925 (2015-05) |
Cross references | EN 62925 (2017-05), IDT |
Weight(kg.) | 0.1255 |
Year | 2017 |
Document history | DIN EN 62925 (2017-11) |
Country | Germany |
Keyword | EN 62925;62925 |