Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Sale!
View larger
View larger
DIN EN 62132-2 VDE 0847-22-2:2011-07
New product
DIN EN 62132-2 VDE 0847-22-2:2011-07
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011More info
This document specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the charcteristics of the TEM cell.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 28 |
| Replace | DIN IEC 62132-2 (2006-08) |
| Cross references | EN 62132-2 (2011-03), IDT |
| Weight(kg.) | 0.1476 |
| Year | 2011 |
| Document history | DIN EN 62132-2 (2011-07) |
| Country | Germany |
| Keyword | DIN EN 62132;EN 62132;EN 62132-2;62132 |