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This part of IEC 60904 describes the procedure for correcting the bias error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum and by the mismatch between the spectral responses (SR) of the reference cell and of the test specimen. The procedure applies only to photovoltaic devices linear in SR as defined in IEC 60904-10. This procedure is valid for single junction devices but the principle may be extended to cover multijunction devices.
Author | VDE |
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Editor | VDE |
Document type | Standard |
Format | Paper |
ICS | 27.160 : Solar energy engineering
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Number of pages | 14 |
Replace | DIN EN 60904-7 (1998-11) |
Cross references | EN 60904-7 (2009-03), IDT |
Weight(kg.) | 0.1238 |
Year | 2009 |
Document history | DIN EN 60904-7 (2009-12) |
Country | Germany |
Keyword | DIN EN 60904;EN 60904;EN 60904-7;60904 |